In a measuring touch probe, the sensor has displacement measuring systems (scales, inductive sensors, optical sensors), usually in all three coordinate axes. If the stylus tip is deflected in any orientation on contact with the measuring object, the magnitude of this deflection can be determined from the information from these displacement measuring systems (Fig. 28). The measurement points are obtained by superimposing the sensor deflection on the sensor position in the machine's Coordinate system. In addition, there is the above-described probe ball correction according to the vectorial position of the surface to be probed and the probe deflection.
Due to the measuring principle of the touch probe, permanent measurement points can be captured during the entire probing process (deflection and return movement). From this, averaged and therefore reproducible measurement points can be determined. The complete probing process can also be recorded and the probing point for an assumed zero deflection (probing with 0 N probing force) can be extrapolated from this. This is useful for measuring flexible workpieces, for example.